Variable Energy Positron Beam Studies of Gold Exposed to Au⁺ and H⁺ Implantation

The results of Doppler broadening the annihilation line spectroscopy obtained using a variable energy positron beam for pure gold samples exposed to 100 keV self-implantation and 250 H+ implantation are reported. characteristics parameter S as function were determined. Irradiation-induced defects confirmed in all measured profiles. However, distributions not typical ion-implanted materials. No significant changes shape defect profiles non-defected self-implanted found. implanted Au+ ions fill earlier produced vacancies decrease overall concentration. In case implantation, distribution does cover area with higher values pointing out presence defects. This is caused by localization inside vacancies. thicknesses damaged layers smaller compared those numerically predicted SRIM ranges. long-range effect was observed.